Effect of Ti content on nanometric substructure and shape memory property in sputter-deposited Ti-rich Ti-Ni thin films

Materials Science Forum

Volumn 327, Issue , 2000, Pages 175-178

  Matsunaga, T ^a   Kajiwara, S ^b   Ogawa, K ^b   Kikuchi, T ^b   Miyazaki, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLIC FILMS; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL); SHAPE MEMORY EFFECT; SPUTTER DEPOSITION; TERNARY SYSTEMS; THIN FILMS;

COHERENT THIN PRECIPITATES; SHAPE MEMORY THIN FILMS; SHAPE RECOVERY STRESS; TITANIUM NICKELIDE;

TITANIUM ALLOYS;

EID: 0033881347     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.327-328.175     Document Type: Article

References (7)

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7. T. Kikuchi, K. Ogawa, S. Kajiwara, T. Matsunaga and S. Miyazaki: Proc. Int. Conf. Solid-Solid Phase Transformation, Kyoto, 1999, in press.