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Volumn 39, Issue 1, 2000, Pages 212-215
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Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFORMATION;
IMAGE ANALYSIS;
IMAGE QUALITY;
SPECKLE;
STRAIN;
STRESS ANALYSIS;
THREE DIMENSIONAL COMPUTER GRAPHICS;
FULL-FIELD NONCONTACT MEASURING TECHNIQUES;
LASER SPECKLE INTERFEROMETRY;
INTERFEROMETRY;
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EID: 0033880136
PISSN: 00913286
EISSN: None
Source Type: Journal
DOI: 10.1117/1.602354 Document Type: Article |
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Times cited : (15)
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References (0)
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