The hard X-ray response of epitaxial GaAs detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 442, Issue 1-3, 2000, Pages 360-363

  Owens, A ^a   Bazdaz, M ^a   Kraft, S ^a   Peacock, A ^a   Nenonen, S ^b   Andersson, H ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b Oxford Instruments Analytical Oy   (Finland)

Author keywords

Detectors; GaAs; X rays

Indexed keywords

ELECTRON ENERGY LEVELS; LEAKAGE CURRENTS; MONTE CARLO METHODS; SEMICONDUCTING GALLIUM ARSENIDE; X RAYS;

ELECTROMAGNETIC PICK UP; ENERGY RESOLUTION; EPITAXIAL GALLIUM ARSENIDE DETECTORS; HARD X RAY MEASUREMENTS; HIGH PURITY MATERIAL;

RADIATION DETECTORS;

EID: 0033880020     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01250-4     Document Type: Article

References (1)

1. A. Owens, M. Bavdaz, S. Kraft, A. Peacock, S. Nenonen, H. Anderson, M. Gagliardi, T. Gagliardi, F. Scholtze, G. Ulm, J. App. Phys. 85 (1999) 7522.