New high-resolution TOF technology

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 443, Issue 1, 2000, Pages 201-204

  Fonte, P ^a   Smirnitski, A ^a   Williams, M C S ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRIC DISCHARGES; FLUOROCARBONS; GLASS;

TIME-OF-FLIGHT (TOF) DETECTORS;

IONIZATION CHAMBERS;

EID: 0033877770     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01008-6     Document Type: Article

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