PIXE, a new technique for the trace element analysis of high explosives

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 792-796

  Lane, D W ^a   Wicks, D C ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IRRADIATION; MANUFACTURE; PROTONS; TRACE ELEMENTS; X RAY SPECTROSCOPY;

FORENSIC ANALYSIS; PARTICLE INDUCED X RAY EMISSION; TRACE ELEMENT ANALYSIS;

EXPLOSIVES;

EID: 0033877512     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00823-X     Document Type: Article

References (8)

1. D.C. Wicks, Trace element analysis of high explosives and their residues by Particle Induced X-ray Emission (PIXE), No. 1 DTC MSc, Cranfield University, RMCS, Shrivenham, Swindon, UK, 1997.
2. E. Clayton, PIXAN: The Lucas Heights PIXE analysis computer package, AAEC/M113, Australian Atomic Energy Commission, 1986.
3. J. Pallon, K.G. Malmqvist, Nucl. Instr. and Meth. 181 (1981) 71.
4. W. Maenhaut, L. De Reu, J. Vandenhaute, Nucl. Instr. and Meth. B 3 (1984) 135.
5. M.E. Limon, Trace element analysis of high explosives and their residues by Particle Induced X-ray Emission (PIXE), No. 2 DTC MSc, Cranfield University, RMCS, Shrivenham, Swindon, UK, 1998.
6. C.O. Ingamells, P. Switzer, Talanta 20 (1973) 547.
7. D.W. Lane, C.A. Duffy, Nucl. Instr. and Meth. B 118 (1996) 392.
8. F.J. Kruger, S. Afr. J. Wildl. Res. 26 (1996) 131.