Analytical and numerical analysis of third-order geometric and first-order chromatic aberrations in a bi-potential electrostatic lens

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 441, Issue 3, 2000, Pages 320-325

  Ximen, Jiye ^a   Liu, Zhixiong ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COMPUTATIONAL METHODS; ELECTROSTATICS; GEOMETRICAL OPTICS; MATHEMATICAL MODELS; NUMERICAL METHODS;

CANONICAL ABERRATION THEORY; CHROMATIC ABERRATION COEFFICIENT; GEOMETRIC ABERRATION; PARAXIAL TRAJECTORY EQUATION;

ELECTROSTATIC LENSES;

EID: 0033876836     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00984-5     Document Type: Article

References (7)

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2. Z. Liu, J. Ximen, Optik (1999) , to be published.
3. W. Glaser, Grundlagen der Elektronenoptik, Springer, Wien 1952 .
4. P.W. Hawkes, E. Kasper, Principles of Electron Optics, Academic Press, London 1989 .
5. Kanaya K., Yamazabi H., Taoba T., Fujita H., Iwanaga M., Shibata S. J. Electron Microsc. 14:1965;196.
6. Glaser W., Robl H. Z. Angew. Math. Phys. 2:1951;444.
7. Ximen J. Adv. in Imaging Electron Phys. 97:1996;359.