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Volumn 114, Issue 7, 2000, Pages 377-381
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Dynamic scaling in growth of platinum films on Si(100)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
MORPHOLOGY;
PLATINUM;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTOR GROWTH;
SILICON WAFERS;
SUBSTRATES;
SURFACE ROUGHNESS;
X RAY SCATTERING;
DYNAMIC SCALING;
SEMICONDUCTING FILMS;
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EID: 0033876589
PISSN: 00381098
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1098(00)00069-7 Document Type: Article |
Times cited : (24)
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References (36)
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