Static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers

Physica B: Condensed Matter

Volumn 276-278, Issue , 2000, Pages 369-370

  Meier, G ^a   Pawelzik, U ^a   Schweika, W ^b   Kockelmann, W ^c  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; NEUTRON SCATTERING; NEUTRON SPECTROMETERS;

PARTIAL STRUCTURE FACTORS; PARTIALLY DEUTERATED POLYMERS; POLYETHYLMETHACRYLATE; POLYHEXYLMETHACRYLATE; WIDE ANGLE NEUTRON SCATTERING;

ACRYLICS;

EID: 0033876396     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01607-5     Document Type: Article

References (3)

1. Gabrys B., Higgins J., Schärpf O. J. Chem. Soc. Faraday Trans. 82:1986;1929.
2. Lamers C., Richter D., Schweika W., Batoulis J., Sommer K., Schärpf O. Physica B. 180/1:1992;515.
3. Miller R., Boyer R., Heijboer J. J. Polym. Sci. Polym. Phys. Ed. 22:1984;2021.