A critical factor to determine the high-temperature creep resistance in cation-doped polycrystalline Al2O3

Key Engineering Materials

Volumn 171-174, Issue , 2000, Pages 809-816

  Yoshida, H ^a   Ikuhara, Y ^a   Sakuma, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Al2O3; Creep Resistance; Grain Boundary Segregation; Molecular Orbital Calculations

Indexed keywords

COMPRESSION TESTING; CREEP; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH TEMPERATURE TESTING; LANTHANUM; POLYCRYSTALLINE MATERIALS; STRESSES; ZIRCONIUM;

CREEP RESISTANCE; LANTHANOID IONS;

ALUMINA;

EID: 0033875864     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

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