Synthetic aperture imaging by scanning acoustic microscopy with vector contrast

Ultrasonics

Volumn 38, Issue 1, 2000, Pages 166-170

  Ndop, J ^a   Kim, T J ^a   Grill, W ^a   Pluta, M ^b  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPES; NONDESTRUCTIVE EXAMINATION; SCANNING; ULTRASONIC TESTING; ULTRASONIC TRANSDUCERS;

PHASE SENSITIVE SCANNING ACOUSTIC MICROSCOPY (PSAM); SYNTHETIC APERTURE IMAGING;

ULTRASONIC IMAGING;

EID: 0033873859     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0041-624X(99)00091-8     Document Type: Article

References (6)

1. Grill W., Hillmann K., Würz K.U., Wesner J. Scanning ultrasonic microscopy with phase contrast. Briggs A., Arnold W. Advances in Acoustic Microscopy. Vol. 2:1996;167 Plenum Press, New York.
2. Grill W., Hillmann K., Kim T.J., Lenkeit O., Ndop J., Schubert M. Scanning acoustic microscopy with vector contrast. Physica B. 263/264:1999;553-558.
3. Ndop J., Kim T.J., Grill W. Spatially resolved characterization of materials by scanning nonfocal surface focused transmission acoustic microscopy with phase contrast. Ultrasonics. 36:1998;461-466.
4. Würz K.U., Wesner J., Hillmann K., Grill W. Determination of elastic constants using a scanning acoustic microscope. Z. Phys. B. 97:1995;487-492.
5. Goodman J.W. Introduction to Fourier Optics. 1996;McGraw-Hill, New York.
6. Pluta M. Advanced Light Microscopy. 1989;PWN/Elsevier, Warsaw/Amsterdam.