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Volumn 361, Issue , 2000, Pages 229-233
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Photoluminescence and X-ray fluorescence measurements of successively thinned CuGaSe2 films
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER COMPOUNDS;
CRYSTAL DEFECTS;
ETCHING;
FLUORESCENCE;
PHOTOLUMINESCENCE;
THIN FILMS;
CHALCOPYRITE;
RAPID THERMAL PROCESSING (RTP);
X RAY FLUORESCENCE;
SEMICONDUCTING FILMS;
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EID: 0033873608
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(99)00839-1 Document Type: Article |
Times cited : (7)
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References (12)
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