Avalanche multiplication and noise in sub-micron Si p-i-n diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3953, Issue , 2000, Pages 95-102

  Tan, Chee Hing ^a   David, J P R ^a   Clark, J ^a   Rees, G J ^a   Plimmer, S A ^a   Robbins, D J ^a   Herbert, D C ^a   Carline, R T ^a   Leong, W Y ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON MULTIPLIERS; MATHEMATICAL MODELS; PHOTODETECTORS; PHOTOIONIZATION; SEMICONDUCTING SILICON; SIGNAL NOISE MEASUREMENT;

AVALANCHE PHOTODIODES; HOLE INJECTION; MIXED CARRIER INJECTION;

AVALANCHE DIODES;

EID: 0033873249     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)