Optical functions of Ca-modified PbTiO3 thin films determined by spectroscopic ellipsometry

Solid State Communications

Volumn 114, Issue 6, 2000, Pages 347-350

  Li, H ^a   Tang, X ^b   Li, Q ^c   Liu, Y ^d   Tang, Z ^a   Zhang, Y ^a   Mo, D ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

^c CHONGQING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^d SHENZHEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; CRYSTAL ORIENTATION; ELLIPSOMETRY; LEAD COMPOUNDS; LIGHT ABSORPTION; REFRACTIVE INDEX; SILICON; SOL-GELS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EXTINCTION COEFFICIENT;

OPTICAL FILMS;

EID: 0033873133     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00053-3     Document Type: Article

References (12)

1. Rao G.M., Krupanidhi S.B. Appl. Phys. Lett. 64:1994;1591.
2. Swartz S.L. IEEE Trans. Electr. Insul. 25:1990;935.
3. Scott J.F., Araujo A. Science. 246:1989;1400.
4. Yamaka E., Watanaba H., Kimura H., Kanaya H., Ohkuma H. J. Vac. Sci. Technol. A. 6:(5):1988;2921.
5. Seifert A., Muralt P., Setter N. Appl. Phys. Lett. 72:1998;2409.
6. Tsuzuki A., Murakami Kani H.K., Watari K., Torii Y. J. Mater. Sci. Lett. 10:1991;125.
7. Calzada M.L., Martin M.J., Ramos P., Mendiola J., Sirera R., Da Silva M.F., Soares J.C. J. Phys. Chem. Solids. 58:1997;1033.
8. Rittenmyer K.M., Ting R.Y. Ferroelectrics. 110:1990;171.
9. Azzam R.M.A., Bashara N.M. Ellipsometry and Polarized Light. 1977;North-Holland, Amsterdam. p. 181.
10. Palik E.D. Handbook of Optical Constants of Solids. 1985;Academic Press, Orlando. 562pp.
11. Tohge N., Fukuda Y., Minami T., Jpn. J. Appl. Phys. 31:1992;4016.
12. Kholkin A., Seifert A., Setter N. Appl. Phys. Lett. 72:(25):1998;3374.