Moire pattern in LEED obtained by van der Waals epitaxy of lattice mismatched WS2/MoTe2(0001) heterointerfaces

Surface Science

Volumn 450, Issue 3, 2000, Pages 181-190

  Tiefenbacher, S ^a   Pettenkofer, C ^a   Jaegermann, W ^b  

^a Abteilung Grenzflächen   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; EPITAXIAL GROWTH; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MOLYBDENUM ALLOYS; THIN FILMS; TUNGSTEN COMPOUNDS;

VAN DER WAALS EPITAXY;

HETEROJUNCTIONS;

EID: 0033872687     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00297-1     Document Type: Article

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