Characterization of plasma nitrided pure titanium by X-ray absorption spectroscopy

Journal of Materials Science

Volumn 35, Issue 7, 2000, Pages 1707-1714

  Palshin, V G ^a   Meletis, E I ^a   Schilling, P J ^b   Tittsworth, R C ^b   Adeev, V M ^c  

^a Louisiana State University   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRON MICROSCOPY; MATHEMATICAL MODELS; NITRIDING; PHASE COMPOSITION; STRUCTURE (COMPOSITION); SURFACES; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; INTENSIFIED PLASMA ASSISTED PROCESSING; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY;

TITANIUM NITRIDE;

EID: 0033872585     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004768216704     Document Type: Article

References (10)

1. J. XU and E. I. MELETIS, in "Beam Processing of Advanced Materials," edited by J. Singh and S. M. Copley (The Metallurgical Society, Warrendale, PA, 1993), p. 551.
2. E. I. MELETIS and S. YAN, J. Vac. Sci. Technol. 11 (1) (1993) 25.
3. T. M. MURALEEDHARAN and E. I. MELETIS, Thin Solid Films 221 (1992) 104.
4. E. I. MELETIS and S. YAN, J. Vac. Sci. Technol. 9(4) (1991) 2279.
5. A. ADJAOTTOR, E. MA and E. I. MELETIS, Surf. Coat. Technol. 89 (1997) 197.
6. D. L. WILLIAMSON, O. OZTURK, R. WEI and P. J. WILBUR, ibid. 65 (1994) 15.
7. G. TOURILLON, E. DARTYGE, A. FONTAINE, M. LEMONNIER and F. BARTOL, Phys. Lett. A, 121 (1987) 251.
8. T. RESSLER, J. Physique IV, 7 (1991) C2-269.
9. E. A. STERN, M. NEWVILLE, B. RAVEL, Y. YACOBY and D. HASKEL, Physica B, 208-209 (1995) 117.
10. J. J. REHR, J. MUSTRE DE LEON, S. I. ZABINSKY and R. C. ALBERS, J. Amer. Chem. Soc. 113 (1991) 5135.