Total-reflection X-ray fluorescence analysis of geological microsamples

Spectrochimica acta, Part B: Atomic spectroscopy

Volumn 55, Issue 3, 2000, Pages 205-212

  Ebert, M ^a   Mair, V ^b   Tessadri, R ^b   Hoffmann, P ^a   Ortner, H M ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BASALT; CORUNDUM; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE; GARNETS; GEOMORPHOLOGY; MINERALOGY; SINGLE CRYSTALS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS (TXRF);

X RAY SPECTROSCOPY;

EID: 0033872173     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(99)00178-0     Document Type: Article

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