Statistical process control in the presence of large measurement variation

Quality Engineering

Volumn 12, Issue 3, 2000, Pages 417-423

  Dechert, Jerry ^a,d,e   Case, Kenneth E ^b,d,e,f   Kautiainen, Timothy L ^c,g,h,i  

^a Dechert and Moses Inc   (United States)

^b Oklahoma State University   (United States)

^c ABBOTT LABORATORIES   (United States)

^d OKLAHOMA STATE UNIVERSITY   (United States)

^e ASEE ^*

^f NATIONAL ACADEMY OF ENGINEERING   (United States)

^g CHILDREN S HOSPITAL LOS ANGELES   (United States)

^h UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

ⁱ Oakton Community College   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; MEASUREMENT ERRORS; MEASUREMENT THEORY;

CLINICAL DIAGNOSTICS MANUFACTURERS;

STATISTICAL PROCESS CONTROL;

EID: 0033872099     PISSN: 08982112     EISSN: None     Source Type: None    
DOI: 10.1080/08982110008962605     Document Type: Article

References (5)

1. Lucas, J. M., The Design and Use of V-Mask Control Schemes, J. Qual. Technol., 8, 1-12 (1976).
2. Crowder, S. V., Design of Exponentially Weighted Moving Average Schemes, J. Qual. Technol., 21, 155-162 (1989).
3. Crowder, S. V., Computation of ARL for Combined Individual Measurement and Moving Range Charts, J. Qual. Technol., 19, 98-102 (1987).
4. Hillier, F. S., X̄ and R Chart Control Limits Based on a Small Number of Subgroups, J. Qual. Technol., 1, 17-26 (1969).
5. Duncan, A. J., Quality Control and Industrial Statistics, 5th ed., Richard D. Irwin, Inc., Homewood, IL, 1986.