APD arrays and large-area APDs via a new planar process

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 442, Issue 1, 2000, Pages 171-178

  Farrell, Richard ^a   Shah, Kanal ^a   Vanderpuye, Kofi ^a   Grazioso, Ronald ^a   Myers, Richard ^a   Entine, Gerald ^a  

^a RADIATION MONITORING DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CESIUM COMPOUNDS; GAIN MEASUREMENT; GAMMA RAYS; PHOSPHORS; PHOTODETECTORS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SILICON WAFERS; SURFACES;

ARRAY PIXEL COINCIDENCE TIMING RESOLUTION; AVALANCHE PHOTODIODES; BEVELED EDGE TYPE; CESIUM IODIDE; ENERGY RESOLUTION;

PHOTODIODES;

EID: 0033871609     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01217-6     Document Type: Article

References (9)

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