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Volumn 17, Issue 1, 2000, Pages 7-15
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Discontinuities driven by a billion connected machines
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Author keywords
[No Author keywords available]
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Indexed keywords
CLIENT SERVER COMPUTER SYSTEMS;
CMOS INTEGRATED CIRCUITS;
DESIGN FOR TESTABILITY;
ELECTRONIC COMMERCE;
INDUSTRIAL ECONOMICS;
INTEGRATED CIRCUIT TESTING;
MARKETING;
MICROPROCESSOR CHIPS;
VLSI CIRCUITS;
AUTOMATIC TEST EQUIPMENT;
AUTOMATIC TEST PATTERN GENERATION;
CENTRAL PROCESSING UNIT;
ELECTRONIC BUSINESS;
INTERNET MARKET;
INTERNET;
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EID: 0033871499
PISSN: 07407475
EISSN: None
Source Type: Journal
DOI: 10.1109/54.825672 Document Type: Article |
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Times cited : (12)
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References (0)
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