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Volumn 276-278, Issue , 2000, Pages 158-159
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New diffractometer ARES for the analysis of residual stresses
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTOMETERS;
FOCUSING;
NEUTRON DETECTORS;
PARTICLE OPTICS;
RESIDUAL STRESSES;
STRESS ANALYSIS;
NEUTRON DIFFRACTOMETERS;
NEUTRON DIFFRACTION APPARATUS;
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EID: 0033871429
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)01295-8 Document Type: Article |
Times cited : (28)
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References (2)
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