Determination of the optical constants of a semiconductor thin film employing the matrix method

IEEE Transactions on Education

Volumn 43, Issue 1, 2000, Pages 63-68

  Martín Palma, Raul J ^a   Martinez Duart J M ^a   Macleod, Angus ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b Thin Film Cent Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; MATHEMATICAL MODELS; REFRACTIVE INDEX; THIN FILMS;

MATRIX METHOD; OPTICAL CONSTANTS;

SEMICONDUCTING FILMS;

EID: 0033871355     PISSN: 00189359     EISSN: None     Source Type: Journal    
DOI: 10.1109/13.825742     Document Type: Article

References (15)

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