Evaluation of the electric field above a specimen surface during SIMS analysis

Analytical Sciences

Volumn 16, Issue 5, 2000, Pages 483-485

  Yamazaki, Hideyuki ^a   Enda, Toshiyuki ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSERS (OPTICAL);

FIELD DISTORTIONS; SIMS ANALYSIS; SPECIMEN SURFACES; UNIFORM ELECTRIC FIELDS;

ELECTRIC FIELDS;

ARTICLE; CHEMICAL ANALYSIS; COMPUTER SIMULATION; ELECTRIC FIELD; ELECTROCHEMICAL ANALYSIS; MASS SPECTROMETRY;

EID: 0033866051     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.16.483     Document Type: Article

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