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Volumn 23, Issue 3, 2000, Pages 229-234
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Quantitative fluorescence microscopy
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Author keywords
Emission wavelengths; Excitation wavelengths; FLIM; FRET
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Indexed keywords
ARTICLE;
CALIBRATION;
EXCITATION;
FLUORESCENCE MICROSCOPY;
IMAGING SYSTEM;
SPECTRUM;
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EID: 0033865705
PISSN: 01478885
EISSN: None
Source Type: Journal
DOI: 10.1179/his.2000.23.3.229 Document Type: Article |
Times cited : (7)
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References (35)
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