Application of spline wavelet transformation to the analysis of extended energy-loss fine structure

Journal of Electron Microscopy

Volumn 49, Issue 4, 2000, Pages 525-529

  Muto, S ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Cardinal B spline function; Discrete wavelet transform; EXELFS; Multi resolution decomposition; Radial distribution function; Short range order

Indexed keywords

ATOMIC PHYSICS; ENERGY DISSIPATION; MULTIRESOLUTION ANALYSIS; NUMERICAL METHODS; UNCERTAINTY ANALYSIS; WAVELET DECOMPOSITION;

ANALYSIS METHOD; CARDINAL SPLINES; DISCRETE-WAVELET-TRANSFORM; EXTENDED ENERGY LOSS FINE STRUCTURES; MULTI RESOLUTION DECOMPOSITION; MULTI-RESOLUTION ANALYSIS; SCALING FUNCTIONS; SPLINE FUNCTIONS; SPLINE WAVELETS; WAVELET TRANSFORMATIONS;

DISCRETE WAVELET TRANSFORMS;

EID: 0033843756     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023839     Document Type: Article

References (9)

1. New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray-absorption fine structure
2. On EXELFS data analysis for obtaining reliable structural parameters
3. Orthonormal bases of compactly supported wavelets
4. A theory for multiresolution signal decomposition: Wavelet representation
5. Extraction of extended X-ray absorption fine structure information from the experimental data using the wavelet transform
6. A practice of data smoothing by B-spline wavelets
7. Three body signature of the bcc structure in extended energy-loss spectra of Cr metal