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Journal of Materials Chemistry

Volumn 10, Issue 8, 2000, Pages 1887-1894

Structure of (Ta2O5)(x)(SiO2)(1-x)xerogels(x=0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, 29Si and 17O MAS NMR and EXAFS

(6) Pickup, D M a Mountjoy, G a Holland, M A a Wallidge, G W a Newport, R J a Smith, M E a

a UNIVERSITY OF KENT (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE; OXYGEN; SILICON; SILICON DERIVATIVE; TANTALUM;

ARTICLE; CATALYSIS; CHEMICAL STRUCTURE; CONFORMATIONAL TRANSITION; INFRARED SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; STRUCTURE ANALYSIS; SYNTHESIS; X RAY DIFFRACTION;

EID: 0033836284 PISSN: 09599428 EISSN: None Source Type: Journal
DOI: 10.1039/b000947o Document Type: Article

Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.