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Volumn 2, Issue 3, 2000, Pages 150-156

Adaptative finite element simulation of currents at microelectrodes to a guaranteed accuracy. Application to a simple model problem

(4) Harriman, Kathryn a Gavaghan, David J a,b Houston, Paul c Süli, Endre a

a UNIVERSITY OF OXFORD (United Kingdom)

b RADCLIFFE INFIRMARY (United Kingdom)

c UNIVERSITY OF LEICESTER (United Kingdom)

Author keywords

Edge effect; Finite element method; Microelectrode; Simulation

Indexed keywords

ACCURACY; ALGORITHM; ARTICLE; CALCULATION; FINITE ELEMENT ANALYSIS; MATHEMATICAL ANALYSIS; MICROELECTRODE; SIMULATION;

EID: 0033834002 PISSN: 13882481 EISSN: None Source Type: Journal
DOI: 10.1016/S1388-2481(99)00159-9 Document Type: Article

Times cited : (33)

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