Crystal-chemical characterization of mixed-valent indium chalcogenides by X-ray absorption spectroscopy (EXAFS)

Zeitschrift fur Kristallographie

Volumn 215, Issue 8, 2000, Pages 445-453

  Epple, M ^a   Panthofer, M ^a   Walther, R ^a   Deiseroth, H J ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGEN; DISULFIDE; INDIUM; THALLIUM;

COMPLEX FORMATION; CRYSTAL; MODEL; MOLECULAR INTERACTION; REVIEW; ROENTGEN SPECTROSCOPY;

EID: 0033819848     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (17)

1. Extended X-ray absorption fine structure (EXAFS) analysis of disorder and multiple-scattering in complex crystalline solids
2. X-ray absorption spectroscopy of amorphous solids, liquids and catalytic and biochemical systems. Capabilities and limitations
3. Reconciling ionic transport properties with atomic structure in oxide glasses
4. Local structure, microstructure and glass properties
5. 2O
6. EXAFS studies on the size-dependence of structural and dynamic properties of CdS-nanoparticles
7. A combined QEXAFS/XRD method for on-line, in situ studies of catalysts: Examples of dynamic measurements of Cu-based methanol catalysts
8. EXAFS characterisation of reforming catalysts: Examples of recent applications
9. The ineluctable need for in situ methods of characterising solid catalysts as a prerequisite to engineering active sites
10. Temperature and pressure dependence of the crystal structure of InTe: A new high-pressure phase of InTe
11. 3
12. 3
13. The UWXAFS analytical package: Philosophy and details
14. High-order multiple-scattering calculations of X-ray absorption fine structure