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Volumn 108, Issue 3 PART I, 2000, Pages 946-948

Measurement of a third-order elastic constant in silicon by a comparison method

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 0033818596     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.1287712     Document Type: Article
Times cited : (4)

References (2)
  • 2
    • 0039102480 scopus 로고    scopus 로고
    • edited by M. F. Hamilton and D. T. Blackstock Academic, New York
    • T. R. Beyer, in NonlbTear Acoustics, edited by M. F. Hamilton and D. T. Blackstock (Academic, New York, 1998), p. 34.
    • (1998) NonlbTear Acoustics , pp. 34
    • Beyer, T.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.