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Volumn 4, Issue 9, 2000, Pages 887-889

Periphery to centre quality control of sputum smear microscopy and 'rapid fading' of Ziehl-Neelsen staining [3] (multiple letters)

Author keywords

[No Author keywords available]

Indexed keywords

ACID FAST BACTERIUM; HUMIDITY; LETTER; MICROSCOPY; PRIORITY JOURNAL; QUALITY CONTROL; SPUTUM SMEAR; STAINING; TEMPERATURE;

EID: 0033817050     PISSN: 10273719     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Letter
Times cited : (4)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.