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Volumn 215, Issue 2, 2000, Pages 77-81
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Twinning by syngonic and metric merohedry. Analysis, classification and effects on the diffraction pattern
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICATE;
ARTICLE;
CRYSTAL STRUCTURE;
GEOMETRY;
STRUCTURE ANALYSIS;
THEORY;
X RAY CRYSTALLOGRAPHY;
X RAY DIFFRACTION;
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EID: 0033808536
PISSN: 00442968
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (60)
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References (26)
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