메뉴 건너뛰기




Volumn 200, Issue 1, 2000, Pages 1-13

Digital imaging in transmission electron microscopy

Author keywords

ASIC; CCD camera; Electron scintillator; Imaging plate; TEM

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CHARGE COUPLED DEVICES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING SYSTEMS;

EID: 0033774875     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2000.00737.x     Document Type: Review
Times cited : (51)

References (43)
  • 23
    • 0002518606 scopus 로고
    • Performance of image converters using slow-scan CCDs in MeV electron microscopy
    • (1992) Optik , vol.92 , Issue.2 , pp. 48-50
    • Herrmann, K.-H.1    Liu, L.2
  • 25
  • 34
    • 0032190811 scopus 로고    scopus 로고
    • The effect of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection
    • (1998) Ultramicroscopy , vol.75 , pp. 23-33
    • Meyer, R.R.1    Kirkland, A.2
  • 40
    • 85169174295 scopus 로고
    • Solid-State Imaging with Charge-Coupled Devices. Kluwer Academic Publishers, Dordrecht
    • (1995)
    • Theuwissen, A.J.P.1
  • 42


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.