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Volumn 44, Issue 4, 2000, Pages 546-555

Extended ISIS sequences insensitive to T1 smearing

Author keywords

Computer simulations; Contamination; ISIS; MRS; Volume selection

Indexed keywords

COMPUTER SIMULATION; CONTAMINATION;

EID: 0033772753     PISSN: 07403194     EISSN: None     Source Type: Journal    
DOI: 10.1002/1522-2594(200010)44:4<546::aid-mrm8>3.0.co;2-7     Document Type: Article
Times cited : (14)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.