The microstructural analysis of SiC nanorods by high-resolution electron microscopy

Journal of Electron Microscopy

Volumn 49, Issue 5, 2000, Pages 641-649

  Wespestad, Vidar G ^a,b   Fritz, Lowell W ^a   Ingraham, W James ^a   Megrey, Bernard A ^a  

^a ALASKA FISHERIES SCIENCE CENTER   (United States)

^b NONE   (United States)

Author keywords

Axis direction; Diameter; High resolution electron microscopy; SiC nanorods; Stacking faults

Indexed keywords

ARTICLE;

SIO;

CARBON; NANORODS; SILICON CARBIDE; STACKING FAULTS;

AXIS DIRECTION; CARBON NANOCAPSULES; DIAMETER; GROWTH MECHANISMS; MICROSTRUCTURAL ANALYSIS; NANO-CAPSULES; REACTION TEMPERATURE; SIC NANOROD; SYNTHESISED; Β- SIC;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 0033765872     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023853     Document Type: Article

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