Quantitative intensity measurement of equal thickness fringes in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate

Journal of Electron Microscopy

Volumn 49, Issue 5, 2000, Pages 607-619

  Nishio, Koji ^a   Isshiki, Toshiyuki ^a   Shiojiri, Makoto ^a,b  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b KANAZAWA MEDICAL UNIVERSITY   (Japan)

Author keywords

Complex potential; Dynamical diffraction theory; Electron diffraction intensity; Energy filtering TEM; Imaging plate; Quantitative measurement

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNESIA; SILICON;

COMPLEX POTENTIALS; DIFFRACTION INTENSITY; DYNAMICAL DIFFRACTION THEORY; ELECTRON DIFFRACTION INTENSITY; ENERGY-FILTERING TEM; IMAGING PLATE; MEASUREMENTS OF; MGO CRYSTALS; QUANTITATIVE MEASUREMENT; SI CRYSTALS;

ELECTRON DIFFRACTION;

EID: 0033765871     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023850     Document Type: Article

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