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Volumn 63, Issue 10, 2000, Pages 1725-1777

High-resolution x-ray scattering measurements: I. Surfaces

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY TECHNIQUE;

EID: 0033753427     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/63/10/203     Document Type: Article
Times cited : (83)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.