Detection of inter-port faults in multi-port static RAMs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 297-302

  Zhao, J ^a   Irrinki, S ^a   Puri, M ^a   Lombardi, F ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL MATHEMATICS; ERROR DETECTION; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; PROBLEM SOLVING; RANDOM ACCESS STORAGE;

FAULT DETECTION; MODIFIED MARCH C ALGORITHM; STATIC RANDOM ACCESS MEMORIES; WRITE INTERPORT DETECTION;

INTEGRATED CIRCUIT TESTING;

EID: 0033752198     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)