Using quantitative electron microscopy for process mineralogy applications

JOM

Volumn 52, Issue 4, 2000, Pages 24-25

  Gottlieb, P ^a   Wilkie, G ^a   Sutherland, D ^a   Ho Tun, E ^a   Suthers, S ^a   Perera, K ^a   Jenkins, B ^a   Spencer, S ^a   Butcher, A ^a   Rayner, J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DATABASE SYSTEMS; IMAGE ANALYSIS; MINERALOGY; MINING; OPTICAL MICROSCOPY; OPTIMIZATION; ORE TREATMENT; SCANNING ELECTRON MICROSCOPY; TEXTURES;

AUTOMATIC IMAGE ANALYSIS SYSTEMS; MICROTEXTURES; QUANTITATIVE ELECTRON MICROSCOPY;

ORE ANALYSIS;

EID: 0033751253     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-000-0126-9     Document Type: Article

References (5)

1. *SEM Image Analysis of Ore Minerals: Volume Fraction, Liberation and Observational Variances," Applied Mineralogy, ed. W.C. Park, D.M. Hausen, and R.D. Hagni (Warrendale, PA: TMS, 1984), pp. 191-204.
2. *SEM Image Analysis in the Determination of Modal Assays, Mineral Association and Mineral Liberation," Proc. XIV Int. Mineral Processing Congress (Toronto, Canada: CIM, 1982), Paper VIII-3.
3. K.R. Weller, S. Morrell, and P. Gottlieb, "Use of Grinding and Liberation Models to Simulate Tower Mill Circuit Performance in a Lead/Zinc Concentrator to Increase Flotation Recovery," Int. J. Miner. Process, 44-45 (1996), pp. 683-702.
4. B.M. Jenkins, R. Zhu, and J. Esterle, "Ergodicity: The Challenge of Sampling for Automated Microscopy in the Minerals Industry," Proc. Digital Image Computing: Techniques and Applications (Brisbane, Australia: APRS, 1995), pp. 401-407.
5. R.P. King and C.L. Schneider, Powder Technology, 98 (1998), pp. 21-37.