Crosstalk effect removal for analog measurement in analog test bus

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 403-408

  Su, Chauchin ^a   Chen, Yue Tsang ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CROSSTALK; DIGITAL SIGNAL PROCESSING; ELECTRONICS PACKAGING; MULTICHIP MODULES; SURFACE MOUNT TECHNOLOGY;

ANALOG BOUNDARY MODULE; ANALOG MEASUREMENT; ANALOG TEST BUS; CHIP SCALE PACKAGING; CIRCUIT UNDER TEST; CROSSTALK EFFECT REMOVAL; TEST BUS INTERFACE CIRCUIT;

INTEGRATED CIRCUIT TESTING;

EID: 0033750076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)