Fault escapes in duplex systems

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 453-458

  Mitra, Subhasish ^a   Saxena, Nirmal R ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ERRORS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; LOGIC PROGRAMMING; ONLINE SYSTEMS; SYSTEMS ANALYSIS;

COMMON MODE FAILURES; CONCURRENT ERROR DETECTION; DATA INTEGRITY; HARDWARE DUPLICATION TECHNIQUES; USER PROGRAMMABLE LOGIC ELEMENTS;

ERROR DETECTION;

EID: 0033750075     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (18)