Sub-systems for optical frequency measurements: application to the 282-nm199hg+ transition and the 657-nm ca line

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 47, Issue 2, 2000, Pages 513-517

  Frech, Bertold ^a   Wells, Josoph S ^a   Oatcs, Chris W ^a   Mitdidl, Jeff ^a   T a n, Yu Fing ^a   Kurosu, Taknynki ^a   Zink, Lyndon ^a   Hollberg, Leo ^a  

^a Frech is Locatal at Schlobstr   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CLOCKS; CESIUM; LASERS; OPTICAL VARIABLES MEASUREMENT;

ATOMIC FREQUENCY STANDARDS; LASER FREQUENCY MEASUREMENT;

FREQUENCY STANDARDS;

EID: 0033749785     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.827445     Document Type: Article

References (12)

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