Controlling and improving the microtribological properties of Langmuir-Blodgett monolayer films using an external electric field

Thin Solid Films

Volumn 368, Issue 1, 2000, Pages 151-155

  Liu, Huiwen ^a   Fujisawa, Satoru ^b   Tanaka, Akihiro ^b   Enomoto, Yuji ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; FRICTION; MONOLAYERS; SCANNING ELECTRON MICROSCOPY; TRIBOLOGY; WEAR OF MATERIALS;

MICROTRIBOLOGY;

LANGMUIR BLODGETT FILMS;

EID: 0033749289     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00733-1     Document Type: Article

References (17)

1. Bhushan B. Handbook of Micro/Nanotribology. 1995;CRC Press, Boca Raton, FL.
2. Bhushan B. Tribology and Mechanics of Magnetic Storage Devices, 2nd ed. 1996;Springer-Verlag, New York.
3. Bhushan B., Kulkarni A.V., Koinkar V.N. Langmuir. 11:1995;3189.
4. Zasadzinski J.A., Viswanathan R., Madsen L., Garnaes J., Schwartz D.K. Science. 263:1994;1726.
5. Meyer E., Overney R., Brodbeck D., Howald L. Phys. Rev. Lett. 21:1992;1777.
6. Bliznyuk V.N., Everson M.P., Tsukruk V.V. J. Tribol. 120:1998;489.
7. Tsukruk V.V., Bliznyuk V.N., Hazel J., Visser D. Langmuir. 12:1996;4840.
8. Ohuchi H., Enomoto Y. Appl. Phys. Lett. 66:1995;1205.
9. Novotny N.J., Karis T.E., Whitefield R.J. Tribol. T. 40:1997;69.
10. Nakayama K. Wear. 178:1994;61.
11. Nakayama K., Ikeda H. Wear. 198:1996;71.
12. Fujisawa S., Enomoto Y. Australia '98, the 5th International Tribology Conference in Australia, December 6-9, 1998, Brisbane. Hargreaves D.J. 1998;497 The Institute of of Engineers, Australia.
13. Meyer G., Amer N.M. Appl. Phys. Lett. 57:1990;2089.
14. Scherer V., Aenold W. Appl. Phys. Lett. 64:1994;1493.
15. Scherer V., Arnold W., Bhushan B. Tribology Issues and Opportunity in MEMS. 1997;463 Kluwer Academic, Boston, MA.
16. Yamanaka K., Ogiso H. Appl. Phys. Lett. 64:1994;178.
17. Yamanaka K., Ogiso H., Kolosov O. Jpn. J. Appl. Phys. 33:1994;3197.