Characterization of a Rydberg atom-based streak camera operating in synchroscan mode

Optics Communications

Volumn 180, Issue 1, 2000, Pages 141-146

  Rella, C W ^a   Van Der Meer, A F G ^b   Noordam, L D ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON EMISSION; ELECTRON GUNS; FREE ELECTRON LASERS; INFRARED RADIATION; OPTICAL RESOLVING POWER; PHOTOCATHODES;

RYDBERG ATOM BASED STREAK CAMERA; SYNCHROSCAN MODE;

STREAK CAMERAS;

EID: 0033746856     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(00)00704-5     Document Type: Article

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