Characterizing subdural EEG electrode grids in a virtual realistic environment

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3976, Issue , 2000, Pages 228-237

  Noordmans, H J ^a   Hoekema, R ^a   van Rijen, P C ^a   van Veelen, C W M ^a   Viergever, M A ^a  

^a UNIVERSITY MEDICAL CENTER UTRECHT   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; ELECTRODES; ELECTROENCEPHALOGRAPHY; IMPLANTS (SURGICAL); PATTERN MATCHING; VIRTUAL REALITY;

SUB-PIXEL ACCURACY; TEMPLATE MATCHING;

MEDICAL IMAGING;

EID: 0033745214     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)