메뉴 건너뛰기




Volumn 14, Issue 1, 2000, Pages 53-67

Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SYSTEMS PROGRAMMING;

EID: 0033744429     PISSN: 08900604     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0890060400141058     Document Type: Article
Times cited : (52)

References (13)
  • 1
    • 0022898712 scopus 로고
    • Sensor-integrated expert system for manufacturing and process diagnostics
    • Lu, S.C.-Y. & Komanduri, R., Eds. ASME PED
    • Agogino, A.M. & Rege, A. (1986). Sensor-integrated expert system for manufacturing and process diagnostics. In Knowledge-Based Experts Systems for Manufacturing, (Lu, S.C.-Y. & Komanduri, R., Eds.) Vol. 24, pp. 67-83, ASME PED.
    • (1986) Knowledge-based Experts Systems for Manufacturing , vol.24 , pp. 67-83
    • Agogino, A.M.1    Rege, A.2
  • 2
    • 0029203530 scopus 로고
    • A methodology for intelligent sensor validation and fusion used in tracking and avoidance of objects for automated vehicles
    • Seattle, Washington
    • Alag, S., Goebel, K., & Agogino, A.M. (1995). A methodology for intelligent sensor validation and fusion used in tracking and avoidance of objects for automated vehicles. Proc. American Control Conf., pp. 3647-3653. Seattle, Washington.
    • (1995) Proc. American Control Conf. , pp. 3647-3653
    • Alag, S.1    Goebel, K.2    Agogino, A.M.3
  • 3
    • 0001818282 scopus 로고    scopus 로고
    • Decision-theoretic troubleshooting: A framework for repair and experiment
    • Technical Report, MSR-TR-96-06. Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052
    • Breese, J.S. & Heckerman, D. (1996) Decision-theoretic troubleshooting: A framework for repair and experiment. Technical Report, MSR-TR-96-06. Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Also appears in Proc. Twelfth Conf. on Uncertainty in Artificial Intelligence.
    • (1996) Proc. Twelfth Conf. on Uncertainty in Artificial Intelligence
    • Breese, J.S.1    Heckerman, D.2
  • 4
    • 0343757791 scopus 로고
    • Real-time value-driven diagnosis
    • Computer Science Department, Oregon State University, Corvallis, Oregon
    • D'Ambrosio, B. (1995). Real-time value-driven diagnosis. Technical Report, Computer Science Department, Oregon State University, Corvallis, Oregon.
    • (1995) Technical Report
    • D'Ambrosio, B.1
  • 6
    • 0343757792 scopus 로고
    • Similarity networks for the construction of multiple-fault belief networks
    • Heckerman, D. (1990). Similarity networks for the construction of multiple-fault belief networks. Proc. Sixth Conf. on Uncertainty in AI.
    • (1990) Proc. Sixth Conf. on Uncertainty in AI
    • Heckerman, D.1
  • 7
    • 0004271194 scopus 로고
    • Troubleshooting under uncertainty
    • Technical Report, MSR-TR-94-07, Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Portions appear in New Paltz, New York
    • Heckerman, D. Breese, J.S., & Rommelse, K. (1994). Troubleshooting under uncertainty. Technical Report, MSR-TR-94-07, Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Portions appear in Proc. Fifth Int. Workshop on Principles of Diagnosis, New Paltz, New York.
    • (1994) Proc. Fifth Int. Workshop on Principles of Diagnosis
    • Heckerman, D.1    Breese, J.S.2    Rommelse, K.3
  • 9
    • 0031199120 scopus 로고    scopus 로고
    • A general equipment diagnostic system and its application on photolithographic sequences
    • Leang, S. & Spanos, C.J. (1997). A general equipment diagnostic system and its application on photolithographic sequences. IEEE Transactions on Semiconductor Manufacturing 10(3).
    • (1997) IEEE Transactions on Semiconductor Manufacturing , vol.10 , Issue.3
    • Leang, S.1    Spanos, C.J.2
  • 10
    • 0004255908 scopus 로고    scopus 로고
    • MIT Press and The McGraw-Hill, New York
    • Mitchell, T.M. (1997). Machine Learning. MIT Press and The McGraw-Hill, New York.
    • (1997) Machine Learning
    • Mitchell, T.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.