-
1
-
-
0022898712
-
Sensor-integrated expert system for manufacturing and process diagnostics
-
Lu, S.C.-Y. & Komanduri, R., Eds. ASME PED
-
Agogino, A.M. & Rege, A. (1986). Sensor-integrated expert system for manufacturing and process diagnostics. In Knowledge-Based Experts Systems for Manufacturing, (Lu, S.C.-Y. & Komanduri, R., Eds.) Vol. 24, pp. 67-83, ASME PED.
-
(1986)
Knowledge-based Experts Systems for Manufacturing
, vol.24
, pp. 67-83
-
-
Agogino, A.M.1
Rege, A.2
-
2
-
-
0029203530
-
A methodology for intelligent sensor validation and fusion used in tracking and avoidance of objects for automated vehicles
-
Seattle, Washington
-
Alag, S., Goebel, K., & Agogino, A.M. (1995). A methodology for intelligent sensor validation and fusion used in tracking and avoidance of objects for automated vehicles. Proc. American Control Conf., pp. 3647-3653. Seattle, Washington.
-
(1995)
Proc. American Control Conf.
, pp. 3647-3653
-
-
Alag, S.1
Goebel, K.2
Agogino, A.M.3
-
3
-
-
0001818282
-
Decision-theoretic troubleshooting: A framework for repair and experiment
-
Technical Report, MSR-TR-96-06. Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052
-
Breese, J.S. & Heckerman, D. (1996) Decision-theoretic troubleshooting: A framework for repair and experiment. Technical Report, MSR-TR-96-06. Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Also appears in Proc. Twelfth Conf. on Uncertainty in Artificial Intelligence.
-
(1996)
Proc. Twelfth Conf. on Uncertainty in Artificial Intelligence
-
-
Breese, J.S.1
Heckerman, D.2
-
4
-
-
0343757791
-
Real-time value-driven diagnosis
-
Computer Science Department, Oregon State University, Corvallis, Oregon
-
D'Ambrosio, B. (1995). Real-time value-driven diagnosis. Technical Report, Computer Science Department, Oregon State University, Corvallis, Oregon.
-
(1995)
Technical Report
-
-
D'Ambrosio, B.1
-
5
-
-
34250352057
-
-
Technical Report, Computer Science Department, Oregon State University, Corvallis, Oregon
-
D'Ambrosio, B. & Burgess, S. (1996). Some experiments with real-time decision algorithms. Technical Report, Computer Science Department, Oregon State University, Corvallis, Oregon.
-
(1996)
Some Experiments with Real-time Decision Algorithms
-
-
D'Ambrosio, B.1
Burgess, S.2
-
6
-
-
0343757792
-
Similarity networks for the construction of multiple-fault belief networks
-
Heckerman, D. (1990). Similarity networks for the construction of multiple-fault belief networks. Proc. Sixth Conf. on Uncertainty in AI.
-
(1990)
Proc. Sixth Conf. on Uncertainty in AI
-
-
Heckerman, D.1
-
7
-
-
0004271194
-
Troubleshooting under uncertainty
-
Technical Report, MSR-TR-94-07, Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Portions appear in New Paltz, New York
-
Heckerman, D. Breese, J.S., & Rommelse, K. (1994). Troubleshooting under uncertainty. Technical Report, MSR-TR-94-07, Microsoft Research, Advanced Technology Division, Microsoft Corporation, One Microsoft Way, Redmond, WA 98052. Portions appear in Proc. Fifth Int. Workshop on Principles of Diagnosis, New Paltz, New York.
-
(1994)
Proc. Fifth Int. Workshop on Principles of Diagnosis
-
-
Heckerman, D.1
Breese, J.S.2
Rommelse, K.3
-
8
-
-
0028575251
-
Automated symbolic traffic scene analysis using belief networks
-
Morgan Kaufmann, San Mateo, California
-
Huang, T., Koller, D., Malik, J., Ogasawara, G., Rao, B., Russell, S., & Weber, J. (1994). Automated symbolic traffic scene analysis using belief networks. Proc. National Conf. on Artificial Intelligence, Morgan Kaufmann, San Mateo, California.
-
(1994)
Proc. National Conf. on Artificial Intelligence
-
-
Huang, T.1
Koller, D.2
Malik, J.3
Ogasawara, G.4
Rao, B.5
Russell, S.6
Weber, J.7
-
9
-
-
0031199120
-
A general equipment diagnostic system and its application on photolithographic sequences
-
Leang, S. & Spanos, C.J. (1997). A general equipment diagnostic system and its application on photolithographic sequences. IEEE Transactions on Semiconductor Manufacturing 10(3).
-
(1997)
IEEE Transactions on Semiconductor Manufacturing
, vol.10
, Issue.3
-
-
Leang, S.1
Spanos, C.J.2
-
10
-
-
0004255908
-
-
MIT Press and The McGraw-Hill, New York
-
Mitchell, T.M. (1997). Machine Learning. MIT Press and The McGraw-Hill, New York.
-
(1997)
Machine Learning
-
-
Mitchell, T.M.1
-
11
-
-
0029235156
-
Application of a Bayesian network to integrated circuit tester design
-
Mittelstadt, D., Paasch, R., & D'Ambrosio, B. (1995). Application of a Bayesian network to integrated circuit tester design. Artificial Intelligence for Engineering, Design and Manufacture 9(1), 51-65.
-
(1995)
Artificial Intelligence for Engineering, Design and Manufacture
, vol.9
, Issue.1
, pp. 51-65
-
-
Mittelstadt, D.1
Paasch, R.2
D'Ambrosio, B.3
-
12
-
-
84921789612
-
Monitoring multi-stage sequential manufacturing processes: A Bayesian approach
-
Rao, S., Strojwas, A., Lehoczky, J., & Schervish, M. (1995). Monitoring multi-stage sequential manufacturing processes: A Bayesian approach. International Symposium on Semiconductor Manufacturing.
-
(1995)
International Symposium on Semiconductor Manufacturing
-
-
Rao, S.1
Strojwas, A.2
Lehoczky, J.3
Schervish, M.4
|