X-ray scattering study of porous silicon layers

Physica B: Condensed Matter

Volumn 283, Issue 1-3, 2000, Pages 135-138

  Chamard, V ^a   Dolino, G ^a   Stettner, J ^b  

^a LIPHY   (France)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTROMAGNETIC WAVE REFLECTION; FRACTALS; INTERFACES (MATERIALS); SURFACE ROUGHNESS; THIN FILMS; X RAY SCATTERING;

DISTORTED WAVE BORN APPROXIMATION (DWBA) THEORY; X RAY REFLECTIVITY (XRR);

POROUS SILICON;

EID: 0033743814     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01906-7     Document Type: Article

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