STM observation of surface vacancies created by ion impact

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 164, Issue , 2000, Pages 650-655

  Seki, Toshio ^a   Aoki, Takaaki ^a   Matsuo, Jiro ^a   Yamada, Isao ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION IN SOLIDS; ION BOMBARDMENT; POINT DEFECTS; RADIATION DAMAGE; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; XENON;

VACANCIES;

SILICON;

EID: 0033743264     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01112-X     Document Type: Article

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