Detection of CMOS defects under variable processing conditions

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 195-201

  Germida, Amy ^a   Plusquellic, James ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEFECTS; FAILURE ANALYSIS; MULTIPLYING CIRCUITS; REGRESSION ANALYSIS; SIGNAL PROCESSING;

CMOS DEFECTS; TRANSIENT SIGNAL ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0033742635     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)