X-ray scattering from freely suspended smectic films: Resolution and other effects

Physica B: Condensed Matter

Volumn 283, Issue 1-3, 2000, Pages 232-236

  Sentenac, D ^a   Fera, A ^a   Opitz, R ^a   Ostrovskii, B I ^b   Bunk, O ^c   De Jeu, W H ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; ELECTROMAGNETIC WAVE REFLECTION; FUNCTIONS; MATHEMATICAL MODELS; SCANNING; X RAY ANALYSIS; X RAY SCATTERING;

BORN APPROXIMATION THEORY; SMECTIC FILMS; X RAY REFLECTIVITY (XRR);

FILMS;

EID: 0033742344     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01978-X     Document Type: Article

References (15)

1. Tolan M. X-ray scattering from soft-matter thin films. Materials Science and Basic Research. Vol. 148:1999;Springer, Berlin.
2. Holy V., Pietsch U., Baumbach T. High Resolution X-ray Scattering from Thin Films and Multilayers, Vol. 149. 1999;Springer, Berlin.
3. Daillant J., Quinn K., Gourier C., Rieutord F. J. Chem. Soc. Faraday Trans. 92:1996;505.
4. Sinha S.K., Tolan M., Gibaud A. Phys. Rev. B. 57:1998;2740.
5. Vlieg E. J. Appl. Cryst. 30:1997;532.
6. Gibaud A., Vignaud G., Sinha S.K. Acta Crystallogr. A. 49:1993;642.
7. de Jeu W.H., Shindler J.D., Mol E.A.L. J. Appl. Crystallogr. 29:1996;511.
8. Mol E.A.L., Shindler J.D., Shalaginov A.N., de Jeu W.H. Phys. Rev. E. 54:1996;536.
9. Sentenac D., Shalaginov A.N., Fera A., de Jeu W.H. J. Appl. Crystallogr. 33:2000;130.
10. Fera A., Ostrovskii B.I., Sentenac D., Samoilenko I., de Jeu W.H. Phys. Rev. E. 60(5):1999;5033.
11. van Kampen N.G. Stochastic Processes in Physics and Chemistry. 1981;North-Holland, Amsterdam.
12. Shalaginov A.N., Romanov V.P. Phys. Rev. B. 48:1993;1073.
13. de Gennes P.G., Prost J. Physics of Liquid Crystals. 1993;Clarendon Press, Oxford.
14. Vertogen G., de Jeu W.H. Thermotropic Liquid Crystals, Fundamentals. 1988;Springer, Berlin.
15. Mach P., Huang C.C., Stoebe T., Wedell E.D., Nguyen T., de Jeu W.H., Guittard F., Naciri J., Shashidhar R., Clark N., Jiang I.M., Kao F.J., Liu H., Nohira H. Langmuir. 14:1998;4330.