Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests

Journal of Materials Science Letters

Volumn 19, Issue 10, 2000, Pages 903-905

  Trtik, P ^a   Reeves, C M ^b   Bartos, P J M ^a  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

^b UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH (MATERIALS); CEMENTS; GLASS FIBERS; INTERFACES (MATERIALS);

GLASS FIBER REINFORCED CEMENTITIOUS COMPOSITES (GRC);

FIBER REINFORCED MATERIALS;

EID: 0033741799     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006758119723     Document Type: Article

References (5)

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3. A. N. NETREVALI, D. STONE, S. RUOFF and L. T. T. TOPOLESKI, Composite Sci. Technol. 34 (1989) 289.
4. W. ZHU and P. J. M. BARTOS, Cement Concrete Res. 27 (1997) 1701.
5. P. TRTIK and P. J. M. BARTOS, Mater. Struct. 32 (1999) 388.