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Volumn , Issue , 2000, Pages 407-412
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Reliability assessment through defect based testing
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
CRYSTAL DEFECTS;
ELECTRIC POTENTIAL;
INTEGRATED CIRCUIT TESTING;
MICROPROCESSOR CHIPS;
MOSFET DEVICES;
SEMICONDUCTOR DEVICE MODELS;
POLYCRITICAL DIMENSIONS (CD);
VLSI CIRCUITS;
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EID: 0033741470
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (8)
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References (19)
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